Type
Part or chapter of a book
Title
National Patterns of Technology Accumulation: Use of Patent Statistics
In
Handbook of quantitative science and technology research. The use of publication and patent statistics in studies of S&T systems
Author(s)
NESTA Lionel (Author)
PATEL Parimal - (Author)
Editor
Dordrecht : Kluwer Academic Publishers
Pages
531 - 552 p.
ISBN
9781402027024
Abstract
EN
We use US Patent Statistics to depict national patterns of technology accumulation in Japan and EU countries. Two properties of country profiles are confirmed, namely, stability over time with a country and differentiation across countries. The main novelty introduced here is the combined analysis of overall technological advantage, performance in fast growing areas and impact. The results show that in many areas of technology in which EU countries have an overall relative advantage, their performance in the subfields of highest technological opportunity is weak. On the other hand, Japan seems to have a consistent level of performance both in aggregate and in fast growing areas.

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